Instructors
Mati Raudsepp
Textbook
Reed, S.J.B. (2005): Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, Cambridge (2nd Ed.).
Lecture Topics
Week
|
Topic
|
1
|
Introduction, Sample preparation
|
2
|
Electron-target interactions and X-ray production, Electron-optical column
|
3
|
Qualititative X-ray analysis, Scanning Electron Microscopy
|
4
|
Scanning Electron Microscopy, Element Mapping
|
5
|
Nature of X-rays and diffraction from crystals
|
6
|
Qualitative phase analysis using powder diffractometry
|
7
|
Quantitative phase analysis using the Rietveld method
|
8
|
Quantitative phase analysis using the Rietveld method
|
9
|
X-ray spectrometers, quantitative X-ray analysis
|
10
|
Quantitative X-ray analysis
|
11
|
Accuracy of X-ray analysis and treatment of results
|
12
|
Review and/or catch up time
|