EOSC 521 · Microbeam and Diffraction Methods for the Characterization of Minerals and Materials

This course is not eligible for Credit/D/Fail grading. [2-3-0]

Course Availability & Schedule

Course Webpage

Instructors

Mati Raudsepp

Textbook

Reed, S.J.B. (2005): Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, Cambridge (2nd Ed.).

Lecture Topics

Week

Topic

1

Introduction, Sample preparation

2

Electron-target interactions and X-ray production, Electron-optical column

3

Qualititative X-ray analysis, Scanning Electron Microscopy

4

Scanning Electron Microscopy, Element Mapping

5

Nature of X-rays and diffraction from crystals

6

Qualitative phase analysis using powder diffractometry

7

Quantitative phase analysis using the Rietveld method

8

Quantitative phase analysis using the Rietveld method

9

X-ray spectrometers, quantitative X-ray analysis

10

Quantitative X-ray analysis

11

Accuracy of X-ray analysis and treatment of results

12

Review and/or catch up time